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| Quantity | Price |
|---|---|
| 1+ | Php2,576.700 |
| 10+ | Php2,462.600 |
| 25+ | Php2,357.600 |
Product Information
Product Overview
The MP-P100 J is a high-performance spring-loaded test probe designed for reliable electrical contact in PCB test fixtures and automated test equipment. With a 1.02mm outer diameter plunger and robust internal construction, it delivers consistent performance in demanding production and inspection environments. The MP-P100 J test probe is ideal for functional testing, in-circuit testing (ICT), and production-line validation where durability, precision, and repeatable electrical performance are essential.
- Durable Contact Materials
- Optimised for 2.54mm (100mil) Pitch Applications
- Extended Travel & Controlled Force
- Full travel: 6.30mm
- Spring pressure (+20% tolerance): 150g / 250g
- Current rating: 3A continuous
- Contact resistance: ≤ 50mΩ
- Mounting hole size: Ø1.75mm
Applications
Automated Test Equipment, Test & Measurement, Electronics Design, Electronics Service, Industrial Automation, Manufacturing, Quality Control, Prototyping, Semiconductor, Research & Development
Technical Specifications
Plunger
Multicomp Pro Test Probe Tips
Test Probes
No SVHC (25-Jun-2025)
Technical Docs (1)
Legislation and Environmental
Country in which last significant manufacturing process was carried outCountry of Origin:China
Country in which last significant manufacturing process was carried out
RoHS
Product Compliance Certificate