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| Quantity | Price |
|---|---|
| 1+ | Php2,576.700 |
| 10+ | Php2,462.600 |
| 25+ | Php2,357.600 |
Product Information
Product Overview
The MP-P100 D is a precision-engineered spring-loaded test probe featuring a 1.5mm outer diameter plunger with a 30° tip design. It is developed for dependable electrical contact in PCB test fixtures, in-circuit testing (ICT), and functional verification applications where accurate alignment and consistent pressure are required. The MP-P100 D combines a robust gold-plated construction with a 30° plunger tip for accurate contact engagement, making it ideal for production testing environments that demand repeatability, durability, and dependable electrical performance.
- Plunger: Full-hard Beryllium Copper, gold-plated over nickel for superior conductivity, durability, and corrosion resistance
- Barrel: Gold-plated brass for long-term reliability
- Spring: Stainless steel to ensure stable mechanical performance
- Receptacle: Gold-plated brass for secure, low-resistance connections
- Recommended minimum centre spacing: 2.54mm (100mil)
- Full travel: 6.30mm
- Spring pressure (+20% tolerance): 150g / 250g
- Current rating: 3A continuous
- Contact resistance: ≤ 50mΩ
- Mounting hole size: Ø1.75mm
Applications
Automated Test Equipment, Test & Measurement, Electronics Design, Electronics Service, Industrial Automation, Manufacturing, Quality Control, Prototyping, Semiconductor, Research & Development
Technical Specifications
Plunger
Multicomp Pro Test Probe Tips
Test Probes
No SVHC (25-Jun-2025)
Technical Docs (1)
Legislation and Environmental
Country in which last significant manufacturing process was carried outCountry of Origin:China
Country in which last significant manufacturing process was carried out
RoHS
Product Compliance Certificate